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@ -13,8 +13,6 @@ env:
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- TEST_PLATFORM="DUE"
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- TEST_PLATFORM="DUE"
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- TEST_PLATFORM="esp32"
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- TEST_PLATFORM="esp32"
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- TEST_PLATFORM="linux_native"
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- TEST_PLATFORM="linux_native"
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- TEST_PLATFORM="LPC1768"
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- TEST_PLATFORM="LPC1769"
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- TEST_PLATFORM="megaatmega2560"
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- TEST_PLATFORM="megaatmega2560"
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- TEST_PLATFORM="STM32F103RE"
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- TEST_PLATFORM="STM32F103RE"
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- TEST_PLATFORM="teensy31"
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- TEST_PLATFORM="teensy31"
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@ -36,6 +34,10 @@ env:
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- TEST_PLATFORM="STM32F103VE_longer"
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- TEST_PLATFORM="STM32F103VE_longer"
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- TEST_PLATFORM="STM32F407VE_black"
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- TEST_PLATFORM="STM32F407VE_black"
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# Put lengthy tests last
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- TEST_PLATFORM="LPC1768"
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- TEST_PLATFORM="LPC1769"
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# Non-working environment tests
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# Non-working environment tests
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#- TEST_PLATFORM="at90usb1286_cdc"
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#- TEST_PLATFORM="at90usb1286_cdc"
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#- TEST_PLATFORM="at90usb1286_dfu"
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#- TEST_PLATFORM="at90usb1286_dfu"
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